Texture and residual macrostress of Ti-N coatingsGOKHMAN, A.Thin solid films. 1993, Vol 228, Num 1-2, pp 229-232, issn 0040-6090Conference Paper

Superconducting thin film thermometers for calorimetric particle detectorsSEIDEL, W.Thin solid films. 1993, Vol 228, Num 1-2, pp 186-188, issn 0040-6090Conference Paper

Calculations for defects formed on diamond surfacesHALICIOGLU, T.Thin solid films. 1993, Vol 228, Num 1-2, pp 293-296, issn 0040-6090Conference Paper

Modelling and computer simulation of ion-beam- and plasma-assisted film growthMÖLLER, W.Thin solid films. 1993, Vol 228, Num 1-2, pp 319-325, issn 0040-6090Conference Paper

In and ex situ diagnostics of the growth of α-Ti thin films deposited by plasma-enhanced physical vapour depositionSTEFFEN, H; WULFF, H; LUNK, A et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 117-120, issn 0040-6090Conference Paper

Initial growth mechanism of Bi-Sr-Ca-Cu-O thin films on SrTiO₃(110) surfaces studied by in-situ reflection high energy electron diffraction observationMIURA, T; ISHIZUKA, Y.Thin solid films. 1993, Vol 228, Num 1-2, pp 189-192, issn 0040-6090Conference Paper

MoS_2-x lubricating films : structure and wear mechanisms investigated by cross-sectional transmission electron microscopyMOSER, J; LEVY, F.Thin solid films. 1993, Vol 228, Num 1-2, pp 257-260, issn 0040-6090Conference Paper

Preparation and structure of Cu-W thin filmsRADIC, N; GRZETA, B; GRACIN, D et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 225-228, issn 0040-6090Conference Paper

The effect of surface aluminum oxide films on thermally induced hillock formationCHANG, C. Y; VOOK, R. W.Thin solid films. 1993, Vol 228, Num 1-2, pp 205-209, issn 0040-6090Conference Paper

The oxidation kinetics of thin copper films studied by ellipsometryRAUH, M; WISSMANN, P.Thin solid films. 1993, Vol 228, Num 1-2, pp 121-124, issn 0040-6090Conference Paper

Hardness and elastic modulus of diamond and diamond-like carbon filmsSAVVIDES, N; BELL, T. J.Thin solid films. 1993, Vol 228, Num 1-2, pp 289-292, issn 0040-6090Conference Paper

High resolution Rutherford backscattering spectroscopy studies on Mo/Si multilayersHEIDEMANN, B; TAPPE, T; SCHMIEDESKAMP, B et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 60-63, issn 0040-6090Conference Paper

Interfacial reaction of MgO/TiO_x superlattice thin filmsIMAI, F; KUNIMORI, K; UCHIJIMA, T et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 158-161, issn 0040-6090Conference Paper

Optical properties of Zr films grown under ion bombardmentTRIGO, J. F; ELIZALDE, E; SANZ, J. M et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 100-104, issn 0040-6090Conference Paper

Oxidation of silicon in r.f. plasma measured by rapid in situ during process ellipsometrySHINNO, H; KITAJIMA, M.Thin solid films. 1993, Vol 228, Num 1-2, pp 129-132, issn 0040-6090Conference Paper

Shape memory thin film of Ti-Ni formed by sputteringISHIDA, A; TAKEI, A; MIYAZAKI, S et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 210-214, issn 0040-6090Conference Paper

Structures of Au and Ti thin films formed at the interface with Si by the plasma processKASHIWAGI, K; SEKIGUCHI, H; MURAYAMA, Y et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 105-108, issn 0040-6090Conference Paper

Thin film growth on an O-precovered Ru(0001) surfaceKALKI, K; SCHICK, M; CEBALLOS, G et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 36-39, issn 0040-6090Conference Paper

Effects of carbon impurities in high Tic superconducting tapes using Auger electron spectroscopySEIBT, E. W; JEREMIE, A; FLÜKIGER, R et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 196-200, issn 0040-6090Conference Paper

In-situ growth of epitaxial YBa₂Cu₃O₇ thin films by on-axis unbalanced d.c. magnetron sputteringSAVVIDES, N; KATSAROS, A.Thin solid films. 1993, Vol 228, Num 1-2, pp 182-185, issn 0040-6090Conference Paper

Preparation and microstructure of reactively sputtered Ti_1-xZr_xN filmsSAKAMOTO, I; MARUNO, S; JIN, P et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 169-172, issn 0040-6090Conference Paper

Reactivity between Ti and N₂-C₂H₂ mixed gas on Ti(C,N) film deposition by arc-like plasma-enhanced ion platingKAJIOKA, H; HIGUCHI, K; KAWASHIMO, Y et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 280-284, issn 0040-6090Conference Paper

Reflection electron microscopy study of thin film growthYAGI, K; MINODA, H; SHIMA, M et al.Thin solid films. 1993, Vol 228, Num 1-2, pp 12-17, issn 0040-6090Conference Paper

X-ray photoelectron spectroscopy and secondary-ion mass spectrometry of boron nitride thin films on austenitic stainless steelINGO, G. M; PADELETTI, G.Thin solid films. 1993, Vol 228, Num 1-2, pp 276-279, issn 0040-6090Conference Paper

ECOSS-17 European Conference on Surface ScienceHABRAKEN, Frans; KLEIJN, Aart; VAN SILFHOUT, Arend et al.Surface science. 1998, Vol 402-04, issn 0039-6028, 945 p.Conference Proceedings